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pv-tools
pv-tools GmbH由Bernhard Fischer于2008年创立Gerd Heintz一直致力于硅太阳能电池的表征，测试系统的自动化以及物理测试的发展过去25年的工具。
我们位于哈默尔恩，那里的重点是原型设计和支持，和Waldburg，公司的总部和生产设施。我们的工作中心是高度自动化的开发和制造硅太阳能电池的测量机器，以协助光伏产业在解决问题和寻找潜在改进方面。
这些机器的输出是一个全面的损失分析由组合的定量评估产生的太阳能电池选择的电光测量。
多功能太阳电池栅线接触电阻测试仪
晶体硅太阳能电池的表面金属欧姆接触的好坏通过接触电阻来反映。在太阳能电池电极优化中，接触电阻是需要考量的一个重要方面。接触电阻的大小不仅与接触的图形有关，还与扩散工艺及接触形成工艺有关。不同栅线图形的欧姆接触好坏可以通过接触电阻率的大小来反映。因此，通过对接触电阻率的研究计算可以反映扩散、电极制作和烧结等工艺中存在的问题。但现在的测量方法存在测量时间长、效率低、精度差等缺陷，而又同时缺少一种专门测量太阳能电池接触电阻的测试设备，因此不利于太阳能电池接触电阻测量在产线上的应用。本技术成果采用TLM法测量接触电阻，结合电机平台、摄像头及计算机控制等技术已基本能实现自动测量和结果分析计算等功能。
TLM-SCAN+
TLM-SCAN+
Contact resistivity and more
This compact instrument measures contact resistivity, finger line resistance, finger width, and finger height of a finished solar cell or on test structures.
Motorized in all axes it is capable of creating maps of all these methods by pushing a single button.
Four point probe heads for measuring the sheet resistance of thin diffused layers and resistivity of wafers make the TLM-SCAN+ a low-cost yet fast and high-quality four-point-probe mapper.
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FPP-SCAN
Four-point-probe mapping with handling system
This off-line instrument is a sheet resistance mapper for the automatic measurement of a stack of more than 100 wafers. The handling time is around 10 seconds, the supported wafer size is between 70 x 70 mm and 166 x 166 mm.
This compact instrument is motorized in all axes to create mappings of sheet resistance and wafer resistivity with 100 points in less than 4 minutes. Single points can be re-measured after navigating the probe head to the desired location with a click on the map.
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Spectral quantum efficiency & reflectance
Spectral quantum efficiency& reflectance
This tool is designed for the automated IQE analysis of
crystalline silicon solar cells. Some features are:
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