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TLM-SCAN+
TLM-SCAN+
TLM-SCAN+ Contact resistivity and more This compact instrument measures contact resistivity, finger line resistance, finger width, and finger height of a finished solar cell or on test structures. Motorized in all axes it is capable of creating maps of all these methods by pushing a single button. Four point probe heads for measuring the sheet resistance of thin diffused layers and resistivity of wafers make the TLM-SCAN+ a low-cost yet fast and high-quality four-point-probe mapper.
Manufacturer:
pv-tools
SKU:
TLM-SCAN+
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Contact resistivity and sheet resistance
The contact resistance of the front metallization is an important contribution to the total series resistance of screen-printed solar cells. The transfer length method with a suitable test structure is the best method to separate the contact resistance from other series resistance effects. However, the contact resistance may vary considerably over the solar cell so a method to measure it with spatial resolution on the finished solar cell is necessary. The TLM-SCAN creates mappings of the contact resistivity of a solar cell that is cut into stripes with a laser or a dicing saw.
The mapping on the right demonstrates the resolution and repeatabilty as it shows the same stripe measured 14 times.
Contact resistivity and more
Microscope camera
This camera is used to measure the contact finger width automatically. The contour detection is helpful to verify that the margin of the fingers is properly identified. Larger dimensions can be measured using the chuck positioning and a crosshair in the image.
Contact resistivity and more
Surface profilometer
The surface topology is scanned using a stylus with a tip radius of 100 µm and a contact force of 10 mN. The automatically evaluated maximum elevation is displayed in the graph. The range is 100 µm, the noise less than 50 nm. This option combined with the finger width measurement is a practicable low-cost alternative to confocal microscopy.
Product tags
接触电阻率
(1)
,
TLM
(1)
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