Laser Diode Characterization System LIV100

Name: Laser Diode Characterization System LIV100
Availability: InStock

0.000 (CNY)

数量:

Powerful short pulse laser diode characterization system for laser diodes and LEDs at the chip, bar or submount level.

The fast rise time with essentially no overshoot allows testing these thermally “naked” devices without undue thermal loading.

CW testing is available up to 20A max. current.